NT-MDT (NTI-Europe)
      Netherlands | Choose country
 Shopping cart
Home | List of products | Contacts | Probe Selection Guide

SPM Accessories

Standard AFM probes

Super Sharp (1nm) tips

"Whisker Type" probes --> high aspect ratio tips

Calibration Gratings

Diamond Coated Conductive Probes

SNOM probes

HOPG (Highly Oriented Pyrolitic Graphite)

Test samples

Search in products:




   
NSG03/Pt/50

Back


Price: €900.00 EUR  Add to cart

Coated_tip

NSG03/Pt/50

High Resolution NONCONTACT "GOLDEN" Silicon Cantilevers NSG03 series with Pt conductive coating
  • Standard chip size: 1.6x3.6x0.4 mm.
  • High reflective Au coating (reflective property is 3 times better in comparison with uncoated cantilevers).
  • Tip side of the chip is coated by Pt conductive coating.
  • Thickness of Pt film is 20-30nm.
  • Typical curvature radius of a tip: 35 nm.
  • Tip height: 10 - 15 µm.
  • Each chip has one RECTANGULAR spring.
  • Recommended for noncontact/semicontact modes.
  • Packaged in GelPak® boxes.

GelPak® is a registered trade mark of Vichem Corporation.

Specification for probes of NSG03 series

Chip thickness 0.4mm
Reflective side Au
Spring number 1
Aspect ratio 3:1
Cone angle j <=22°
Curvature radius of a tip typical 10nm
   

Cantilever series

Spring

Cantilever lenght, L±5µm

Cantilever width, W±3µm

Cantilever thickness, µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

min

typical

max

NSG03

A

130

35

1.0

1.2

1.4

70

90

116

0.5

1.1

2,2

Cantilever series

Recommended measuring mode
N - noncontact, semicontact
C - contact
cantilever series S - with calibrated SEM photo for each tip and guaranteed curvature


Copyright © 1998 - 2008, NT-MDT. All rights reserved.

Probe Selection Guide

Specify your application to see the products that meet your requirements

Shopping Help

Ask for help

Delivery & Handling

Request a catalog

Request a deconvo program

Distributors