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NSG30/Pt/15
15 chips of High Resolution NONCONTACT "GOLDEN" Silicon Cantilevers NSG30 series with PtIr conductive coating
PROBES GENERAL INFORMATION
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NSG30/Pt series specification |
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Material |
Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped |
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Chip size |
3.4x1.6x0.3mm |
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Reflective side |
Au |
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Conductive coating |
PtIr (25nm), Cr adhesion layer (25A) |
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Cantilever number |
1 rectangular |
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Tip curvature radius |
~ 35nm |
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Also available coatings |
conductive TiN, Au |
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Available NSG30 probes |
bare, tipless, with Al reflective coating | |
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Cantilever series |
Cantilever length, L±5µm |
Cantilever width, W±3µm |
Cantilever thickness,
T±0.5 µm |
Resonant frequency, kHz |
Force constant, N/m |
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min |
typical |
max |
min |
typical |
max |
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NSG30 |
125 |
40 |
4.0 |
240 |
320 |
440 |
22 |
40 |
100 |
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