NT-MDT (NTI-Europe)
USA
 Shopping cart
Home | List of products | Contacts | Probe Selection Guide | Image Contest

SPM Accessories

ETALON probes NEW

Standard AFM probes

Super Sharp (1nm) tips

"Whisker Type" probes --> high aspect ratio tips

Calibration Gratings

Diamond Coated Conductive Probes

SNOM probes

HOPG and Substrates

Test samples

Search in products:




   
Contact Probes

Back


Tip CSG01/15

Price: $350.00 USD

15 chips for contact mode CSG01 series, resonant frequency 4-17kHz, force constant 0,003-0,13N/m.

 Add to cart


Tip CSG01/50

Price: $910.00 USD

50 chips for contact mode CSG01 series, resonant frequency 4-17kHz, force constant 0,003-0,13N/m.

 Add to cart


Tip CSG10/15

Price: $350.00 USD

15 chips for contact mode CSG10 series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m.

 Add to cart


Tip CSG10/50

Price: $910.00 USD

50 chips for contact mode CSG10 series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m.

 Add to cart


Golden tip CSG11/15

Price: $580.00 USD

15 chips for contact mode CSG11 series, each chip has two cantilevers, resonant frequency 7-14kHz, 14-28kHz; force constant 0,01-0,08N/m, 0,03-0,2N/m.

 Add to cart


Golden tip CSG11/50

Price: $1,450.00 USD

50 chips for contact mode CSG11 series, each chip has two cantilevers, resonant frequency 7-14kHz, 14-28kHz; force constant 0,01-0,08N/m, 0,03-0,2N/m.

 Add to cart


Tip CSG30/15

Price: $350.00 USD

NEW PRODUCT! 15 chips for CONTACT/SEMICONTACT modes CSG30 series, resonant frequency 26-76kHz, force constant 0,6-2 N/m. Specially designed for the applications when it's not clearly defined which mode should be used for sample investigation or when it's necessary to provide measurements in both modes of the same sample area without tip remove.

 Add to cart


Tip CSG30/50

Price: $910.00 USD

NEW PRODUCT! 50 chips for CONTACT/SEMICONTACT modes CSG30 series, resonant frequency 26-76kHz, force constant 0,6-2 N/m. Specially designed for the applications when it's not clearly defined which mode should be used for sample investigation or when it's necessary to provide measurements in both modes of the same sample area without tip remove.

 Add to cart


Copyright © 1998 - 2010, NT-MDT. All rights reserved.

Probe Selection Guide

Specify your application to see the products that meet your requirements

Shopping Help

Ask for help

Delivery & Handling

Request a catalog

Request a deconvo program

Distributors