|
 |
 Back
NSG30/15
| 15 chips of High Resolution NONCONTACT "GOLDEN" Silicon Cantilevers NSG30 series |
PROBES GENERAL INFORMATION
NSG30 series specification |
|
|
Material |
Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped |
|
Chip size |
3.4x1.6x0.3mm |
|
Reflective side |
Au |
|
Cantilever number |
1 rectangular |
|
Tip curvature radius |
typical 6nm, guaranteed 10nm |
|
Available coatings |
conductive PtIr, TiN, Au |
|
Available probe |
bare, tipless, with Al reflective coating | |
|
|
Cantilever series |
Cantilever length, L±5µm |
Cantilever width, W±3µm |
Cantilever thickness,
T±0.5 µm |
Resonant frequency, kHz |
Force constant, N/m |
|
min |
typical |
max |
min |
typical |
max |
|
NSG30 |
125 |
40 |
4.0 |
240 |
320 |
440 |
22 |
40 |
100 |
Copyright © 1998 - 2010, NT-MDT. All rights reserved.
|
|
|
|
