Netherlands
|
Choose country
Shopping cart
Home
|
List of products
|
Contacts
|
Probe Selection Guide
ETALON probes
NEW
Standard AFM probes
Super Sharp (1nm) tips
"Whisker Type" probes --> high aspect ratio tips
Calibration Gratings
Diamond Coated Conductive Probes
SNOM probes
HOPG (Highly Oriented Pyrolitic Graphite)
Test samples
Search in products:
Back
AFM calibration
Company NT-MDT supply with the full set of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
List of products
AFM submicron calibration (278nm)
Company NT-MDT supply with the grating for SPM and STM submicron calibration in X or Y direction.
List of products
Test grating for SNOM
Company NT-MDT supply with the special test grating for Scanning Near Field Optical Microscope.
List of products
Grating sets
Company NT-MDT offer three different grating sets.
List of products
Copyright © 1998 - 2008, NT-MDT. All rights reserved.
Probe Selection Guide
Specify your application to see the products that meet your requirements
---
Engineering industry
Life Sciences (Biology, Biotechnology)
Magnetic Materials
Material Science
Nanoelectronics
Nanomaterials
Nanostructures
Polymers and Thin Organic Films
Semiconductors
Shopping Help
Ask for help
Delivery & Handling
Request a catalog
Request a deconvo program
Distributors
