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SPM Accessories

Standard AFM probes

Super Sharp (1nm) tips

"Whisker Type" probes --> high aspect ratio tips

Calibration Gratings

Diamond Coated Conductive Probes

SNOM probes

HOPG (Highly Oriented Pyrolitic Graphite)

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AFM calibration

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TGG1 TGG1

Price: €200.00 EUR

Test grating TGG1 is intended for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, detection of angular distortion, tip characterization.

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TGQ1 TGQ1

Price: €300.00 EUR

Calibration grating TGQ1 is intended for simultaneous calibration in X,Y,and Z directions.

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TGT1 TGT1

Price: €200.00 EUR

Test grating TGT1 is intended for for 3-D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control.

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TGX1 TGX1

Price: €200.00 EUR

Test grating TGX1 is intended for lateral calibration of SPM scanners, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip aspect ratio.

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TGZ TGZ1

Price: €100.00 EUR

Calibration grating TGZ1 for SPM Z-axis calibration (step height 18,5±1nm).

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TGZ TGZ2

Price: €100.00 EUR

Calibration grating TGZ2 for SPM Z-axis calibration (step height 108,5±2nm).

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TGZ TGZ3

Price: €100.00 EUR

Calibration grating TGZ1 for SPM Z-axis calibration (step height 535±4nm).

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