Price: €400.00 EUR

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NSC05_20°/5

NSC05_20° - "Whisker Type" probes for noncontact/semicontact modes

Near Vertical Structure Measurements

• "Whisker Type" tips go deeper inside narrow gaps when the standard cantilevers fail to measure the bottom and to control near vertical sidewalls.
  Fig. a: SPM image obtained by "Whisker type" tip.
  Fig. b: SPM image obtained by usual silicon cantilever.
• "Whisker Type" tip material is hydrophobic, hard and mechanically stable.
• Because each different model SPM cantilever holder varies in its angle of inclination, the angle at which it holds the tip, we offer programmable control of the "Whisker Type" tip to make the tip truly perpendicular to the surface you are measuring.
• Any angle of inclination "a" you need to match your SPM holder specification can be produced. Just specify the angle of inclination you want (Fig. c).

Calibrated SEM photos

Free calibrated SEM photo for each "Whisker Type" tip to let you know its real shape.

Fig. a: SEM image of "Whisker" tip specially designed for measurement of samples with near vertical sidewalls.   Fig. b: SEM image of four "Whisker" tips grown on the silicon tip in accordance with preset sketch.

"Whisker" tip specification

 

Material carbin (carbon modification) Aspect ratio better than 10:1 Angle j <= 10° Curvature radius of: uncoated tip magnetic Co coated tip   typical 10nm typical 20nm Àngle of inclination a* 20°±1°

* - any other inclination angle a can be considered

Cantilever specification (can be changed to probe series NSG01 without notification)

Chip thickness H: 0,4mm.
Reflective side coating: Au.
Chip has one straight spring.

NSC05_20° - for noncontact mode.

	Cantilever lenght, L±5µm	Cantilever width, W±3µm	Cantilever thickness, µm			Resonant frequency, kHz			Force constant, N/m			"Whisker" tip length**, µm
			min	typical	max	min	typical	max	min	typical	max	min	typical	max
noncontact	100	35	1.7	2.0	2.3	190	255	325	5.5	11.5	22.5	0.8	1	1.2

** - other "Whisker" length can be considered

At customer's requirement tip side of the probes can be coated by conductive coating.
Other cantilever specifications are available. Please, contact us for more information.