Growth and characterization of ZnO nanocrystalline thin film deposited by Thermal evporation method

ZnO nano-needle arrays have been grown on glass substrates deposited by thermal evaporation method, The structural and surface properties of ZnO thin film was studied by using XRD and AFM techniques. XRD patterns confirmed that grown film is single crystalline and AFM revealed that ZnO nanoneedle have perfect sharp tips with a small roughness value (2nm). Pt Schottky contacts on ZnO thin film then fabricated. the fabricated Schottky diode was successfully tested and it gave good rectifying conduct with Pt metal contacts.