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SPM Accessories

ETALON probes NEW

Standard AFM probes

Super Sharp (1nm) tips

"Whisker Type" probes --> high aspect ratio tips

Calibration Gratings

Diamond Coated Conductive Probes

SNOM probes

HOPG and Substrates

Test samples

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ProImage Contest 2009 is closed. NT-MDT Co. thanks all the participant, we hope our Contest was interesting and useful for you! The Company is happy to provide reliable equipment for our clients’ scientific needs that give birth to the great discoveries in different fields of application. We wish you success in your further research and hope to see your brilliant results.


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