| 14.10.2011 |
New TGZ4 grating
TGZ4 - new calibration grating in the TGZ series is available now! Step height 1317nm, period 3um. |
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| 12.09.2011 |
ProIMAGE Contest 2011 is open!
NT-MDT invites the customers to take part in the ProIMAGE Contest 2011. Every month the author of the best image gets USD 1000! |
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| 22.06.2011 |
New website
Welcome to our newly redesigned website!
Knowing the value of your time, we’ve rebuilt our site to make it much easier to find and buy high-quality NT-MDT probes and accessories.
We hope you find the changes useful.
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| 10.06.2011 |
SiC sample
New products - Silicon Carbide sample for accurate small scale calibration of AFM scanners with near uniform distribution of half-monolayer high (0.75 nm) or monolayer high (1.5 nm) steps. |
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| 15.02.2011 |
From 02/15/2011 to 03/15/2011 buy any "Whisker Type" probes ...
From 02/15/2011 to 03/15/2011 buy any "Whisker Type" probes with 15% discount and get free 4 Gb USB flash drive with calibrated SEM photo for each "Whisker Type" tip |
