AFM & nano-Spectroscopy Systems

  
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AFM submicron calibration (278nm)

Company NT-MDT Spectrum Instruments supply with the grating for SPM and STM submicron calibration in X or Y direction.

$214 (Add to cart)
Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
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