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AFM, SNOM, TERS probes, test samples & calibration gratings

Enhance your AFM to a new, unrivaled level
Leading the way in nanoscale analysis

Latest news

03.09.2020, NT-MDT SPECTRUM INSTRUMENTS HAS PREPARED A SCIENTIFIC DIGEST ON TERS

2020 is indisputably a challenging time that impacted all of us to some extent and changed our lifestyles. Yet, we hope that you went through the most critical pandemic time without losses and, as pandemic shows the downtrend, is getting ready to return to research. Our team took advantage of some operations downtime and analyzed scientific papers published in 2019 with the help of our equipment. The result was impressive: more than 1,000 articles with an average journal impact factor of 4.61. We are very happy about our customers’achievements and honored to be a part of your success.

We also work on several digests to highlight the most remarkable scientific works, and today we are sending the first one: Tip Enhanced Raman Scattering. A copy of this digest you can find on our website.

26.05.2020, JOIN OUR #CHALLENGEAFM4FREE PROGRAM

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05.02.2020, XXIV SYMPOSIUM “NANOPHYSICS AND NANOELECTRONICS”

Starting from 1997-1998 the annual International Symposium "Nanophysics and Nanoelectronics" (nanosymp.ru/en/about) continues regular discussions on topical issues in such areas as the physics of semiconductor nanostructures, X-ray optics and scanning probe microscopy with the participation of all research groups in Russia, actively working in this field and with the participation of scientists from abroad.

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The Symposium scientific thematic covers a wide range of subjects of Condensed Matter Physics, its relevance is dictated by the large number of papers in this field in Russia and abroad, this trend is one of priority directions of science, technology and engineering in Russia.

Honorary President of NT-MDT Spectrum Instruments Bykov Victor Alexandrovich (Moscow, Russia) will make a guest report “From the first STM to nanotechnological systems for complex surface analysis - 30 years of experience in development and development” at the session in area “Measurements and technologies of atomic and nanometer scale based on probe, electron-beam and ion-beam methods”

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