01.10.2016, Special offer OCTOBER-NOVEMBER 2016
For orders made in October and November of 2016 we announce a new special offer:
- 20% discount for all boxes of 15 cantilevers of Golden and Etalon series.
- 12% discount for all other cantilevers’ boxes of the same Golden and Etalon series.
For any questions or placing an order, please, contact us:
Evgeniy Lisov – email@example.com;
Agne Mazgelyte - firstname.lastname@example.org.
27.09.2016, Single crystal diamond AFM probes with high aspect ratio
We’re glad to present the new product in our assortment: AFM cantilevers with single crystal diamond (SCD) tips. This type of probes is represented by a very narrow diamond (CVD-grown) needle glued to a standard tipless Si cantilever.
AFM probes prepared by such technology show several features, especially relevant to AFM scans:
- SCD tip’s cone angle is less than 10 degrees. Thus a diamond needle will get into deep trenches and between high particles, providing detailed topography images.
- Single crystal diamond tip’s end is very hard. As the result wear of such cantilevers is several times slower than for standard silicon ones. Low deformation of a tip will be the great utility for elasticity investigations and simple nanoindentation or force lithography experiments.
- SCD tip has got low surface energy and it works well for sticky biological samples.
SCD AFM cantilevers are constantly used by our best application scientists: Sergey Magonov and Marko Surtchev. Thus we’re absolutely sure in quality of these probes.
To the right you can see a scan of so-called “Black silicon” relief. Such surface can be constructed by a special etching experiment and is used in solar cells.
Main challenges in visualization of “black silicon” pyramids are their heights that reach 6-7 um. Standard cantilever can’t get between such high and densely grown structures. But as the one may see from the scan, SCD probes worked well. Sharp pyramid’s shape and well-defined flat areas between them approve high quality of the scan.
Now SCD cantilevers are presented in our assortment by the models NSG30/SCD and FMG01/SCD with the same lever’s parameters as for corresponding ones of Golden series. But by the request SCD needles can be glued to any types of tipless cantilevers of Golden and Etalon series.
Also we provide an additional discount 15% for any models of SCD probes till the end of October 2016.
29.08.2016, NT-MDT microscopes were involved into more than 1000 scientific researches in 2015
Over 1000 articles written with help of NT-MDT microscopes were published in year 2015 in top scientific journals with average impact factor of 3,2. List of selected papers can be found here.
21.07.2016, AFM cantilevers with conductive coating TiN
We’re glad to announce that AFM probes with titanium nitride (TiN) coating appeared in our assortment again.
High hardness of this material and its melting temperature around 3500 C provides its utility in wide range of applications.
Since July TiN coated AFM cantilevers are presented in our stock by models: NSG01/TiN and FMG01/TiN. If you need AFM probes with other resonance and stiffness parameters, please, don’t hesitate to write to Lisov@ntmdt.ru
(Evgeniy Lisov). In future we’re going to extend TiN assortment over all models of Golden series.
Refreshing our production range we also announce the new special: with any offer made in August the one may claim to try conductive TiN cantilevers. And we will send a test box of three NSG01/TiN or FMG01/TiN probes for free. We will also appreciate if you share with us your opinion after trying these probes later!