AFM & nano-Spectroscopy Systems

  
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01.09.2017, September 2017 special offer

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28.08.2017, NT-MDT SI Participates at mmc2017

NT-MDT Spectrum Instruments were proud to participate at mmc2017 one of Europe’s largest exhibition dedicated to microscopy and imaging. The Microscience Microscopy 2017 was held at Manchester Central Convention Complex July 03rd- 06th 2017. A total of 1340 people registered to attend mmc2017 which is the latest in an impressive list of events dating back to the 1960’s starting with the Micro conference and exhibition series. This later became Microscience which grew ever-bigger until 2010. The RMS hosted the European Microscopy Congress in 2012 which was the catalyst for the current Microscience Microscopy Congress series.

NT-MDT SI has a unique and unrivalled portfolio of scanning probe microscopes, from cutting edge scientific research to routine surface investigations. Our application-focused instruments provide you with a full range of capabilities in AFM-Raman, high-resolution, multi-frequency measurements, and AFM based nanomechanics. As an innovator in SPM for over 20 years, NT-MDT SI has a specialised high-performance solution for your research needs.

Dr Sergey Lemeshko Head of European Sales at NT-MDT SI performed live demonstrations on our highest performance AFM TITANIUM. The TITANIUM Atomic Force Microscope (AFM) incorporates revolutionary developments of NT-MDT SI to provide the highest level of performance and ease of use. Featuring the Revolution Cartridge for Multi-probe Cartridge operation and innovative HybriD mode paired with low noise and low drift performance TITANIUM sets a new standard in atomic force microscopy. Please find more details about this revolutionary AFM here http://www.ntmdt-si.com/automated-afm/titanium

NT-MDT SI was also involved in the Pre-Congress SPM workshop “Practical Tips for AFM Imaging and Spectroscopy”. The workshop provided an advanced in depth introduction to SPM at a level suitable for graduate students who have started using or developing SPM in their own research, and for experienced electron and optical microscopists who would like to know how they could use SPM.

NT-MDT SI would like to thank all those that took the time to visit our booth #714 at mmc2017 and look forward to meeting you at future events and workshops.

Please follow this link to find out more information on future NT-MDT SI Workshops & Events
http://www.ntmdt-si.com/

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13.07.2017, NT-MDT SI participates at 3rd Bologna SPM Workshop

NT-MDT Spectrum Instruments are proud to announce their participation at the 3rd Bologna SPM Workshop in association with our Italian partners Pra.Ma. This one day workshop will take place in the University of Bologna, Italy on July 14th 2017.

Representing NT-MDT Spectrum Instruments at this workshop is Dr Sergey Lemeshko which is the Head of European Sales who will deliver a talk on “Material contrast mapping with nanometer resolution by Apertureless Scanning Near-Field Microscopy”. Dr Lemeshko will deliver his talk in the morning session of the workshop as part of the Innovations in Scanning Probe Microscopy between 12.40-13.00hrs. Alongside Dr S. Lemeshko will be Dr V. Polyakov Head of R&D at NT-MDT Spectrum Instruments.

From cutting edge scientific research to routine surface investigations, NT-MDT Spectrum Instruments has a unique and unrivalled portfolio of Scanning Probe Microscopes. Our application-focused instruments provide you with a full range of capabilities in AFM-Raman, high-resolution, multi-frequency measurements, and AFM based nanomechanics.

To view full details of the Programme for this workshop please visit our website via the following link http://www.cristallografia.org/uploaded/4072.pdf

For more details on NT-MDT Spectrum Instruments devices and upcoming Events please visit http://www.ntmdt-si.com/

28.06.2017, NT-MDT Spectrum Instruments Exhibits at E-MRS Spring Meeting 2017

NT-MDT Spectrum Instruments were proud to participate at E-MRS Spring Meeting 2017 France, Strasbourg, May 22nd – 26th 2017. From cutting edge scientific research to routine surface investigations, NT-MDT Spectrum Instruments has a unique and unrivalled portfolio of Scanning Probe Microscopes. Our application-focused instruments provide you with a full range of capabilities in AFM-Raman, high-resolution, multi-frequency measurements, and AFM based nanomechanics.

The E-MRS Spring Meeting and Exhibit 2017 took place in the extended and modernized Convention Centre of Strasbourg (France). The conference consisted of 26 parallel symposia with invited speakers, oral and poster presentations and a plenary session to provide and international forum for discussing recent advances in the field of material science.

NT-MDT Spectrum Instruments presented our TITANIUM device at Booth # 77 where our experts such as Chérif Salhi Sales Manager Responsible for the French Market email:salhi@ntmdt-si.eu along with Dr Sergey Lemeshko email:lemeshko@ntmdt-si.eu was happy to meet visitors and run live demonstrations delivering results in real time.

For further information on upcoming events and workshops for NT-MDT Spectrum Instruments please visit http://www.ntmdt-si.com/

NT-MDT Spectrum Instruments would like to thank all those that visited us at E-MRS Spring Meeting 2017 and look forward to meeting you at future events.

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