AFM & nano-Spectroscopy Systems

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May 2017 special offer

NT-MDT SI spring activities in Europe and USA

Last month NT-MDT Spectrum Instruments participated several specialized conferences and exhibitions around Europe and USA.

Some of them are:

  • Lednice SPM Workshop in Česká republika;
  • Graphene Conference in Barcelona;
  • Sondes Locales SPM forum in Mountpellier France;
  • 4th Annual Conference on Optical NanoSpectroscopy in Lisbon, Portugal;
  • SI DPG in Dresden, Deutschland;
  • APS in New Orleans, LA

NT-MDT SI demonstrated the modern solutions for Scanning Probe Microscopy and ran life demonstrations and sample measurements on the TITANIUM, SOLVER Nano and the NTEGRA systems. The reports and presentations of various applications in AFM / QNM / SNOM / AFM-Raman / TERS and IR s-SNOM modes were also introduced while the workshops.

We would like to appreciate all the visitors coming to our booths worldwide for your attention and the interest to our products and innovations. We are happy to provide scientific researches with the most complete and up to date instrumentation and support.

See you on the upcoming events!

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NT-MDT Spectrum Instruments Exhibits at DPG 2017 Spring Meeting

NT-MDT Spectrum Instruments proudly exhibited at the recent DPG 2017 Spring Meeting in Germany, Dresden, March 19th- 24th 2017. The conference took place this year at TU Dresden. DPG Spring meetings take place at varying locations and is one of the largest Physics Congresses in Europe attracting almost 10,000 Physicists from all over the world to participate.

From cutting edge scientific research to routine surface investigations, NT-MDT Spectrum Instruments has a unique and unrivalled portfolio of Scanning Probe Microscopes. Our application-focused instruments provide you with a full range of capabilities in AFM-Raman, high-resolution, multi-frequency measurements, and AFM based nanomechanics.

Dr Sergey Lemeshko Sales Manager responsible for the German Market presented TITANIUM, our revolutionary AFM, on which he generated high quality scans and delivered results in real time.

NT-MDT Spectrum Instruments would like to sincerely thank all those that visited us at Booth # 80 Zelt A and met with our experts to discuss your AFM needs and were happy to find solutions.

For further information on upcoming events and workshops for NT-MDT Spectrum Instruments please visit

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Sondes Locales, Forum SPM 201


NT-MDT was delighted to have the opportunity to exhibit and take part at Sondes Locales 2017 in Montpellier Juvignac France from the 20th to 24th of March 2017.

This conference was the 20th edition of its kind, the local organising committee made this event a unique opportunity for synthesis and perspective for the Nano Technology Community.

NT-MDT will also be exhibiting at various Conferences and Exhibitions throughout the rest of 2017. Please check our Events section on our website for more information.

MRS 2016

NT-MDT Spectrum Instruments is excited to take part at MRS Fall Meeting & Exhibit 2016 November 27 – December 2 in Boston, Massachusets.

Location: Hynes Convention Center
Level 2,
900 Boylston Street
Boston, Massachusetts 02115
Booth Number: 923

The increasingly cross-disciplinary worldwide activity in materials research manifests itself every year in the MRS Fall Meetings. Featuring over 50 symposia and attended by as many as 6,000 researchers from every corner of the globe, the annual Fall Meeting in Boston’s Hynes Convention Center and Sheraton Boston Hotel is the preeminent annual event for those in the field of materials research.

Please, visit us at Booth 923. Our engineers will be glad share with you our news and latest developements, to demostrate work of our AFM equipment and to provide our visitors free samples of Golden (NSG10, CSG01) and Etalon (HA_NC, HA_C) series cantilevers.

2016 MRS Fall Meeting


Single crystal diamond AFM probes with high aspect ratio


We’re glad to present the new product in our assortment: AFM cantilevers with single crystal diamond (SCD) tips. This type of probes is represented by a very narrow diamond (CVD-grown) needle glued to a standard tipless Si cantilever.

AFM probes prepared by such technology show several features, especially relevant to AFM scans:

  • SCD tip’s cone angle is less than 10 degrees. Thus a diamond needle will get into deep trenches and between high particles, providing detailed topography images.
  • Single crystal diamond tip’s end is very hard. As the result wear of such cantilevers is several times slower than for standard silicon ones. Low deformation of a tip will be the great utility for elasticity investigations and simple nanoindentation or force lithography experiments.
  • SCD tip has got low surface energy and it works well for sticky biological samples.

SCD AFM cantilevers are constantly used by our best application scientists: Sergey Magonov and Marko Surtchev. Thus we’re absolutely sure in quality of these probes.

To the right you can see a scan of so-called “Black silicon” relief. Such surface can be constructed by a special etching experiment and is used in solar cells.

Main challenges in visualization of “black silicon” pyramids are their heights that reach 6-7 um. Standard cantilever can’t get between such high and densely grown structures. But as the one may see from the scan, SCD probes worked well. Sharp pyramid’s shape and well-defined flat areas between them approve high quality of the scan.

Now SCD cantilevers are presented in our assortment by the models NSG30/SCD and FMG01/SCD with the same lever’s parameters as for corresponding ones of Golden series. But by the request SCD needles can be glued to any types of tipless cantilevers of Golden and Etalon series.

Also we provide an additional discount 15% for any models of SCD probes till the end of October 2016.

NT-MDT microscopes were involved into more than 1000 scientific researches in 2015
Over 1000 articles written with help of NT-MDT microscopes were published in year 2015 in top scientific journals with average impact factor of 3,2. List of selected papers can be found here.
AFM cantilevers with conductive coating TiN
We’re glad to announce that AFM probes with titanium nitride (TiN) coating appeared in our assortment again.
High hardness of this material and its melting temperature around 3500 C provides its utility in wide range of applications.
Our practice of AFM measurements shows that thin films of TiN spread over AFM cantilever’s tip’s end are stable in high currents and any standard force loads that arise in the contact AFM technique. Our first cantilevers with conductive TiN coating were prepared and investigated in 1998 as the result of the common project of NT-MDT and State Research Institute for Problems in Physics (V. Shevyakov, S. Lemeshko, V. Roschin. Conductive SPM probes of base Ti or W refractory compounds. Nanotechnology, 9 (1998) 352-355).
Since July TiN coated AFM cantilevers are presented in our stock by models: NSG01/TiN and FMG01/TiN. If you need AFM probes with other resonance and stiffness parameters, please, don’t hesitate to write to (Evgeniy Lisov). In future we’re going to extend TiN assortment over all models of Golden series.
Refreshing our production range we also announce the new special: with any offer made in August the one may claim to try conductive TiN cantilevers. And we will send a test box of three NSG01/TiN or FMG01/TiN probes for free. We will also appreciate if you share with us your opinion after trying these probes later!


Kavli Prize in Nanoscience

Sincere congratulations to G.Binning,C.Gerber and C.Quate with #Kavli2016 Nanoscience Award for the invention and realization of atomic force microscopy, a breakthrough in measurement technology and nanosculpting that continues to have a transformative impact on nanoscience and technology!

NT-MDT presents conductive probes with the modified coating W2C+

Due to volume doping with anticorrosion elements the new coating W2C+, which was earlier proven to be stable under high currents and pressures, may also work for a long time in high humidity atmosphere.

Several experiments were carried out to check the result. Two sets of probes coated by W2C and W2C+ layers correspondingly were being placed into atmosphere of more than 90% humidity for several days. Performance capabilities of the probes were tested by current-voltage curves and scans on HOPG. Before being held in humid air all cantilevers worked correctly showing good conductivity. But already after 8 days old-type coating have lost their conductive properties. The same time probes W2C+ didn’t stop conducting even after 16 days of storage in 90% and more humidity.

We’re also delighted to announce that since June 2016 we will sell only new W2C+ probes from our web-site. The same time, cost of this model stays the same.
More of all, we will be glad if our customers try these probes’ possibilities on practice. When the one orders any model of conductive probes from our web-site ( this summer we will add to the order a test box of 3 cantilevers HA_C/W2C or HA_NC/W2C at choice.

For more information - please, visit NT-MDT main web-site.

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