NT-MDT Spectrum Instruments – research, production, sales and support  of wide range AFMs and AFM-Raman-Nano-IR Systems

            

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TERS AFM probes new
Product Description Price
TERS
TERS probes based on AFM Top Visual cantilevers provide TERS (and AFM) performance in Semicontact/Noncontact mode, uncoated, resonant frequency 200-400 kHz, force constant 25-95 N/m.
TERSSET/7 (7 separated chips): 2.030 € (Add to cart)
TERSSET/10 (10 separated chips): 2.900 € (Add to cart)
AFM probe ETALON series new
Product Description Price
HA_C
High Accuracy Contact AFM probes HA_C series, each chip has 2 cantilevers, resonant frequency 37 kHz / 19 kHz, force constant 0,65 N/m / 0,26 N/m.
HA_C/15 (15 separated chips): 310 € (Add to cart)
HA_C/50 (50 separated chips): 910 € (Add to cart)
HA_C/Au
High Accuracy Contact AFM probes HA_C series with Au tip and reflective coating, each chip has 2 cantilevers, resonant frequency 37 kHz / 19 kHz, force constant 0,65 N/m / 0,26 N/m.
HA_C/Au/15 (15 separated chips): 390 € (Add to cart)
HA_C/Au/50 (50 separated chips): 1.020 € (Add to cart)
HA_CNC
High Accuracy Contact AFM probes HA_CNC series, each chip has 2 cantilevers, resonant frequency 46 kHz / 66 kHz, force constant 1.0 N/m / 1.5 N/m.
HA_CNC/15 (15 separated chips): 310 € (Add to cart)
HA_CNC/50 (50 separated chips): 910 € (Add to cart)
HA_C/Pt
High Accuracy Contact AFM probes HA_C series with Pt tip and reflective coating, each chip has 2 cantilevers, resonant frequency 37 kHz / 19 kHz, force constant 0,65 N/m / 0,26 N/m.
HA_C/Pt/15 (15 separated chips): 390 € (Add to cart)
HA_C/Pt/50 (50 separated chips): 1.020 € (Add to cart)
HA_C/tipless
High Accuracy Contact AFM probes HA_C series without tips, each chip has 2 cantilevers, resonant frequency 37 kHz / 19 kHz, force constant 0,65 N/m / 0,26 N/m.
HA_C/tipless/50 (50 separated chips): 750 € (Add to cart)
HA_C/tipless/15 (15 separated chips): 260 € (Add to cart)
HA_FM
High Accuracy Force Modulation AFM probes HA_FM series, each chip has 2 cantilevers, resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m.
HA_FM/50 (50 separated chips): 910 € (Add to cart)
HA_FM/15 (15 separated chips): 310 € (Add to cart)
HA_FM/Au
High Accuracy Force Modulation AFM probes HA_FM series with Au conductive coating, each chip has 2 cantilevers, resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m.
HA_FM/Au/15 (15 separated chips): 390 € (Add to cart)
HA_FM/Au/50 (50 separated chips): 1.020 € (Add to cart)
HA_FM/CoFe
AFM cantilevers for work in the semicontact mode HA_FM (High Accuracy Force Modulation). Each chip contains two cantilevers with resonance frequencies 114 kHz / 77 kHz and force constant 6 N/m / 3.5 N/m. Probes are covered with CoFe layer for MFM measurements.
HA_FM/CoFe/50 (50 separated chips): 1.380 € (Add to cart)
HA_FM/CoFe/15 (15 separated chips): 495 € (Add to cart)
HA_FM/Pt
High Accuracy Force Modulation AFM probes HA_FM series with Pt conductive coating, each chip has 2 cantilevers, resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m.
HA_FM/Pt/15 (15 separated chips): 390 € (Add to cart)
HA_FM/Pt/50 (50 separated chips): 1.020 € (Add to cart)
HA_FM/W2C+
NEW!!! High Accuracy High Resonance frequency noncontact AFM probes HA_FM series with stable and wear-resistant long lifetime W2C conductive coating, each chip has 2 cantilevers,resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m. W2C+ conductive coating is modified to provide better stability in high humidity conditions.
HA_FM/W2C/15 (15 separated chips): 390 € (Add to cart)
HA_FM/W2C/50 (50 separated chips): 1.020 € (Add to cart)
HA_HR
High Accuracy High Resonance frequency noncontact AFM probes HA_HR series, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m.
HA_HR/50 (50 separated chips): 910 € (Add to cart)
HA_HR/15 (15 separated chips): 310 € (Add to cart)
HA_HR/Au
High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with Au conductive coating, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m.
HA_HR/Au/15 (15 separated chips): 390 € (Add to cart)
HA_HR/Au/50 (50 separated chips): 1.020 € (Add to cart)
HA_HR/Pt
High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with Pt conductive coating, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m.
HA_HR/Pt/15 (15 separated chips): 390 € (Add to cart)
HA_HR/Pt/50 (50 separated chips): 1.020 € (Add to cart)
HA_HR/W2C+
NEW!!! High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with stable and wear-resistant long lifetime W2C conductive coating, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m. W2C+ conductive coating is modified to provide better stability in high humidity conditions.
HA_HR/W2C/15 (15 separated chips): 390 € (Add to cart)
HA_HR/W2C/50 (50 separated chips): 1.020 € (Add to cart)
HA_NC
High Accuracy NonContact AFM probes HA_NC series, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m.
HA_NC/50 (50 separated chips): 910 € (Add to cart)
HA_NC/15 (15 separated chips): 310 € (Add to cart)
HA_NC/Au
High Accuracy NonContact AFM probes HA_NC series with Au conductive coating, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m.
HA_NC/Au/15 (15 separated chips): 390 € (Add to cart)
HA_NC/Au/50 (50 separated chips): 1.020 € (Add to cart)
HA_NC/Pt
High Accuracy NonContact AFM probes HA_NC series with Pt conductive coating, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m.
HA_NC/Pt/15 (15 separated chips): 390 € (Add to cart)
HA_NC/Pt/50 (50 separated chips): 1.020 € (Add to cart)
HA_NC/tipless
High Accuracy NonContact AFM probes HA_NC series without tips, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 8 N/m / 3.5 N/m.
HA_NC/tipless/15 (15 separated chips): 260 € (Add to cart)
HA_NC/tipless/50 (50 separated chips): 750 € (Add to cart)
HA_NC/W2C+
NEW!!! High Accuracy High Resonance frequency noncontact AFM probes HA_NC series with stable and wear-resistant long lifetime W2C conductive coating, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m. W2C+ conductive coating is modified to provide better stability in high humidity conditions.
HA_NC/W2C/15 (15 separated chips): 390 € (Add to cart)
HA_NC/W2C/50 (50 separated chips): 1.020 € (Add to cart)
AFM probes GOLDEN series
Product Description Price
CSG01
Probes for contact mode CSG01 series, resonant frequency 4-17kHz, force constant 0,003-0,13N/m.
CSG01/15 (15 separated chips): 350 € (Add to cart)
CSG01/50 (50 separated chips): 950 € (Add to cart)
CSG01/Au
Contact SPM probes CSG01 series with Au conductive coating, resonant frequency 4-17kHz, force constant 0,003-0,13N/m.
CSG01/Au/15 (15 separated chips): 420 € (Add to cart)
CSG01/Au/50 (50 separated chips): 1.250 € (Add to cart)
CSG01/Pt
Contact SPM probes CSG01 series with Pt conductive and reflective coatings, resonant frequency 4-17kHz, force constant 0,003-0,13N/m.
CSG01/Pt/15 (15 separated chips): 420 € (Add to cart)
CSG01/Pt/50 (50 separated chips): 1.250 € (Add to cart)
CSG01_tipless
Contact mode probes of CSG01 series without tips, each chip has one cantilever, resonant frequency 4-17kHz; force constant 0,003-0,17N/m.
CSG01_tipless/15 (15 separated chips): 470 € (Add to cart)
CSG01/tipless/50 (50 separated chips): 1.165 € (Add to cart)
CSG10
Probes for contact mode CSG10 series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m.
CSG10/15 (15 separated chips): 350 € (Add to cart)
CSG10/50 (50 separated chips): 950 € (Add to cart)
CSG10/Au
Contact SPM probes CSG10 series with Au conductive coating, resonant frequency 8-39kHz, force constant 0,01-0,5N/m.
CSG10/Au/50 (50 separated chips): 1.250 € (Add to cart)
CSG10/Au/15 (15 separated chips): 420 € (Add to cart)
CSG10/Pt
Contact SPM probes CSG10 series with Pt conductive and reflective coatings, resonant frequency 8-39kHz, force constant 0,01-0,5N/m.
CSG10/Pt/15 (15 separated chips): 420 € (Add to cart)
CSG10/Pt/50 (50 separated chips): 1.250 € (Add to cart)
CSG30
NEW PRODUCT! Probes for CONTACT/SEMICONTACT modes CSG30 series, resonant frequency 26-76kHz, force constant 0,6-2 N/m.
Specially designed for the applications when it's not clearly defined which mode should be used for sample investigation or when it's necessary to provide measurements in both modes of the same sample area without tip remove.
CSG30/15 (15 separated chips): 350 € (Add to cart)
CSG30/50 (50 separated chips): 950 € (Add to cart)
CSG30/Pt
NEW PRODUCT!for CONTACT/SEMICONTACT modes CSG30 series with Pt conductive and reflective coatings, resonant frequency 26-76kHz, force constant 0,6-2 N/m. Specially designed for the applications when it's not clearly defined which mode should be used for sample investigation or when it's necessary to provide measurements in both modes of the same sample area without tip remove.
CSG30/Pt/15 (15 separated chips): 420 € (Add to cart)
CSG30/Pt/50 (50 separated chips): 1.250 € (Add to cart)
FMG01
for Force Modulation Mode FMG01 series, resonant frequency 40-96kHz, force constant 1-5N/m.
FMG01/15 (15 separated chips): 350 € (Add to cart)
FMG01/50 (50 separated chips): 950 € (Add to cart)
FMG01/Au
for Force Modulation Mode FMG01 series with Au conductive coating, resonant frequency 47-90 kHz, force constant 1-5 N/m.
FMG01/Au/50 (50 separated chips): 1.060 € (Add to cart)
FMG01/Au/15 (15 separated chips): 420 € (Add to cart)
FMG01/Pt
for Force Modulation Mode FMG01 series with PtIr conductive and reflective coatings, resonant frequency 47-90 kHz, force constant 1-5 N/m.
FMG01/Pt/15 (15 separated chips): 420 € (Add to cart)
FMG01/Pt/50 (50 separated chips): 1.060 € (Add to cart)
MFM01
High resolution long lifetime magnetic probes MFM01 series
MFM01/50 (50 separated chips): 2.150 € (Add to cart)
MFM01/15 (15 separated chips): 690 € (Add to cart)
MFM_HC
High Coercivity High Resolution Magnetic Probes MFM_HC.
MFM_HC/15 (15 separated chips): 975 € (Add to cart)
MFM_HC/50 (50 separated chips): 3.250 € (Add to cart)
MFM_LM
Low Moment High Resolution Magnetic probes MFM_LM series
MFM_LM/50 (50 separated chips): 3.050 € (Add to cart)
MFM_LM/15 (15 separated chips): 950 € (Add to cart)
MFMSET/15
Set of 15 High resolution long lifetime magnetic probes MFM01, MFM_LM.
628 € (Add to cart)
NSG01
AFM кантилеверы для работы в прерывисто-контактном режиме серии NSG01, резонансная частота 87-230 кГц, постоянная жесткости 1,45-15,1 Н/м.
NSG01/50 (50 separated chips): 950 € (Add to cart)
NSG01/15 (15 separated chips): 350 € (Add to cart)
NSG01/Au
Noncontact SPM probes NSG01 series with Au conductive coating, resonant frequency 87-230kHz, force constant 1,45-15,1N/m.
NSG01/Au/15 (15 separated chips): 420 € (Add to cart)
NSG01/Au/50 (50 separated chips): 1.250 € (Add to cart)
NSG01/Pt
Noncontact SPM probes NSG01 series with PtIr conductive and reflective coatings, resonant frequency 87-230kHz, force constant 1,45-15,1N/m.
NSG01/Pt/15 (15 separated chips): 420 € (Add to cart)
NSG01/Pt/50 (50 separated chips): 1.250 € (Add to cart)
NSG03
AFM probes for noncontact/semicontact modes NSG03 series, resonant frequency 47-150kHz, force constant 0,35-6,1N/m.
NSG03/15 (15 separated chips): 350 € (Add to cart)
NSG03/50 (50 separated chips): 950 € (Add to cart)
NSG03/Au
for noncontact/semicontact modes NSG03 series with Au conductive coating, resonant frequency 47-150kHz, force constant 0,35-6,1N/m.
NSG03/Au/15 (15 separated chips): 420 € (Add to cart)
NSG03/Au/50 (50 separated chips): 1.250 € (Add to cart)
NSG03/Pt
Noncontact/semicontact probes NSG03 series with Pt conductive and reflective coatings, resonant frequency 47-150kHz, force constant 0,35-6,1N/m.
NSG03/Pt/50 (50 зондовых датчиков): 1.250 € (Add to cart)
NSG03/Pt/15 (15 зондовых датчиков): 420 € (Add to cart)
NSG10
AFM Probes for noncontact/semicontact modes NSG10 series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m.
NSG10/50 (50 separated chips): 950 € (Add to cart)
NSG10/15 (15 separated chips): 350 € (Add to cart)
NSG10/Au
Noncontact SPM probes NSG10 series with Au conductive coating, resonant frequency 140-390kHz, force constant 3,1-37,6N/m.
NSG10/Au/15 (15 separated chips): 420 € (Add to cart)
NSG10/Au/50 (50 separated chips): 1.250 € (Add to cart)
NSG10/Pt
Noncontact SPM probes NSG10 series with PtIr conductive and reflective coatings, resonant frequency 140-390kHz, force constant 3,1-37,6N/m.
NSG10/Pt/50 (50 separated chips): 1.060 € (Add to cart)
NSG10/Pt/15 (15 separated chips): 420 € (Add to cart)
NSG30
AFM Probes for noncontact/semicontact modes NSG30 series, resonant frequency 240-440kHz, force constant 22-100N/m
NSG30/15 (15 separated chips): 350 € (Add to cart)
NSG30/50 (50 separated chips): 950 € (Add to cart)
NSG30/Au
noncontact probes NSG30 series with Au conductive coating, resonant frequency 240-440kHz, force constant 22-100N/m.
NSG30/Au/50 (50 separated chips): 1.250 € (Add to cart)
NSG30/Au/15 (15 separated chips): 420 € (Add to cart)
NSG30/Pt
Noncontact probes NSG30 series with PtIr conductive and reflective coating, resonant frequency 240-440kHz, force constant 22-100N/m.
NSG30/Pt/50 (50 separated chips): 1.060 € (Add to cart)
NSG30/Pt/15 (15 separated chips): 420 € (Add to cart)
NSG30_tipless
Noncontact/semicontact mode probes of NSG30 series without tips, each chip has 1 cantilever, resonant frequency 240-440kHz; force constant 22-100N/m.
NSG30_tipless/15 (15 separated chips): 470 € (Add to cart)
NSG30/tipless/50 (50 separated chips): 1.165 € (Add to cart)
NSG_L
Long Type AFM probes for noncontact/semicontact modes NSG_L series, resonant frequency 160-225kHz, force constant 36-90N/m.
NSG_L/15 (15 separated chips): 350 € (Add to cart)
NSG_L/50 (50 separated chips): 950 € (Add to cart)
Cantilever sets
Product Description Price
MFMSET/15
Set of 15 High resolution long lifetime magnetic probes MFM01, MFM_LM.
628 € (Add to cart)
UNISET/25
Cantilever set for contact, noncontact/semicontact, MFM, LAO Lithography, SRM, EFM, SCM, SKM modes.
600 € (Add to cart)
UNISET/50
Cantilever set for contact, noncontact/semicontact, PFM, SRM, EFM, SCM, SKM modes.
1.260 € (Add to cart)
Super Sharp AFM probes new
Product Description Price
FMG01_SS
Super Sharp AFM probes for Force Modulation Mode FMG01 series, resonant frequency 47-90kHz, force constant 1-5N/m, Al reflective coating.
FMG01_SS/10 (10 separated chips): 730 € (Add to cart)
HA_HR_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series HA_HR.
HA_HR_DLC/50 (50 separated chips): 3.940 € (Add to cart)
HA_HR_DLC/10 (10 separated chips): 788 € (Add to cart)
NSG01_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01.
NSG01_DLC/50 (50 separated chips): 3.940 € (Add to cart)
NSG01_DLC/10 (10 separated chips): 788 € (Add to cart)
NSG10_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10.
NSG10_DLC/10 (10 separated chips): 788 € (Add to cart)
NSG10_DLC/50 (50 separated chips): 3.940 € (Add to cart)
NSG30_SS
Super Sharp AFM Probes for noncontact/semicontact modes NSG30 series, resonant frequency 200-440kHz, force constant 22-100N/m, Al reflective coating.
NSG30_SS/10 (10 separated chips): 730 € (Add to cart)
High aspect ratio AFM cantilevers
Product Description Price
CSC05_10°
"Whisker Type" probes for contact modes with whisker inclination angle 10 degree
CSC05_10°/5 (5 separated chips): 400 € (Add to cart)
CSC05_20°
"Whisker Type" probes for contact modes with whisker inclination angle 20 degree.
CSC05_20°/5 (5 separated chips): 400 € (Add to cart)
FMG01/SCD/5
Single crystal full diamond high aspect ratio AFM probes for precise measurements of samples with high particles or deep trenches. Based on FMG01 cantilevers with resonant frequency 40-96kHz, force constant 1-5N/m, Au reflective coating. Tip cone angle is less than 10 degrees.
450 € (Add to cart)
HA_NC_w10
"Whisker Type" probes for noncontact/semicontact modes with whisker inclination angle 10 degrees.
HA_NC_w10/5 (5 separated chips): 400 € (Add to cart)
HA_NC_w20
"Whisker Type" probes for noncontact/semicontact modes with whisker inclination angle 20 degree
HA_NC_w20/5 (5 separated chips): 400 € (Add to cart)
NSC05_10°
"Whisker Type" probes for noncontact/semicontact modes with whisker inclination angle 10 degrees.
NSC05_10°/5 (5 separated chips): 400 € (Add to cart)
NSC05_20°
"Whisker Type" probes for noncontact/semicontact modes with whisker inclination angle 20 degree
NSC05_20°/5 (5 separated chips): 400 € (Add to cart)
NSG30/SCD/5
Single crystal full diamond high aspect ratio AFM probes for precise measurements of samples with high particles or deep trenches. Based on NSG30 cantilevers with resonant frequency 240-440kHz, force constant 22-100N/m, Au reflective coating. Tip cone angle is less than 10 degrees.
450 € (Add to cart)
TOP VISUAL Probes
Product Description Price
VIT_P
TOP VISUAL non-contact AFM probes (typical resonant frequency 300 kHz, typical force constant 50 N/m), uncoated.
VIT_P/50 (50 separated chips): 1.790 € (Add to cart)
VIT_P/15 (15 separated chips): 560 € (Add to cart)
VIT_P_C-A
TOP VISUAL Contact AFM probes (typical resonant frequency 16 kHz, typical force constant 0,3 N/m), Al reflective coating.
VIT_P_C-A/50 (50 separated chips): 1.790 € (Add to cart)
VIT_P_C-A/15 (15 separated chips): 630 € (Add to cart)
VIT_P_C/Pt
TOP VISUAL Contact AFM probes (typical resonant frequency 16 kHz, typical force constant 0,3 N/m) with Pt conductive cover from both tip and reflective sides.
VIT_P_C/Pt/15 (15 separated chips): 830 € (Add to cart)
VIT_P_C/Pt/50 (50 separated chips): 2.390 € (Add to cart)
VIT_P/IR
TOP VISUAL non-contact AFM probes (typical resonant frequency 300 kHz, typical force constant 50 N/m), Al reflective coating.
VIT_P/IR/50 (50 separated chips): 1.620 € (Add to cart)
VIT_P/IR/15 (15 separated chips): 630 € (Add to cart)
VIT_P/Pt
TOP VISUAL non-contact AFM probes (typical resonant frequency 300 kHz, typical force constant 50 N/m) with Pt conductive cover from both tip and reflective sides.
VIT_P/Pt/50 (50 separated chips): 2.390 € (Add to cart)
VIT_P/Pt/15 (15 separated chips): 1.100 € (Add to cart)
SNOM cantilevers new
Product Description Price
SNOM_C
SNOM aperture cantilevers for contact mode
SNOM_C/10 (10 separated chips): 2.190 € (Add to cart)
SNOM_NC
SNOM aperture cantilevers for semicontact mode
SNOM_NC/10 (10 separated chips): 2.190 € (Add to cart)
SNOM fiber probes
Product Description Price
MF001
Set of 10 SNOM probes (wavelength 400-550nm), without tuning forks.
2.100 € (Add to cart)
MF002
Set of 10 SNOM probes (wavelength 450-600nm), without tuning forks.
2.100 € (Add to cart)
MF003
Set of 10 SNOM probes (wavelength 600-680nm), without tuning forks.
2.100 € (Add to cart)
MF004
Set of 10 SNOM probes (wavelength 780-970nm), without tuning forks.
2.100 € (Add to cart)
MF005
Set of 10 SNOM probes (wavelength 980-1600nm), without tuning forks.
2.100 € (Add to cart)
Calibration Gratings
Product Description Price
TGG1
Test grating TGG1 is intended for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, detection of angular distortion, tip characterization.
200 € (Add to cart)
TGQ1
Calibration grating TGQ1 is intended for simultaneous calibration in X,Y,and Z directions.
300 € (Add to cart)
TGS1
Grating set for Z-axis SPM calibration with three different height range - 20nm, 110nm, 520nm.
235 € (Add to cart)
TGS1F
Grating set for Z-axis SPM calibration with four different height range - 20nm, 110nm, 520nm, 1400nm.
450 € (Add to cart)
TGS2
Grating set for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
900 € (Add to cart)
TGSFull
Full set of calibration standards for SPM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
1.150 € (Add to cart)
TGT1
Test grating TGT1 is intended for for 3-D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control.
300 € (Add to cart)
TGX1
Test grating TGX1 is intended for lateral calibration of SPM scanners, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip aspect ratio.
200 € (Add to cart)
TGZ1
Calibration grating TGZ1 for SPM Z-axis calibration (step height 20,0±2nm).
100 € (Add to cart)
TGZ2
Calibration grating TGZ2 for SPM Z-axis calibration (step height 110±10 nm).
100 € (Add to cart)
TGZ3
Calibration grating TGZ3 for SPM Z-axis calibration (step height 520±20 nm).
100 € (Add to cart)
HOPG, Substrates, Test Samples
Product Description Price
DNA01
Long-life, stable and non-destructing object for AFM.
150 € (Add to cart)
GRAS_DS/1.0x10x10
HOPG ZYA Quality, double-sided, piece size 10x10mm, thickness 1,0mm
GRAS_DS/1.0 : 270 € (Add to cart)
GRAS_DS/1.5x10x10
HOPG ZYA Quality, double-sided, piece size 10x10 mm, thickness 1,5mm
GRAS_DS/1.5 : 345 € (Add to cart)
GRAS_DS/2.0x10x10
HOPG ZYA Quality, double-sided, piece size 10x10 mm, thickness 2,0 mm
GRAS_DS/2.0 : 405 € (Add to cart)
GRBS_DS/1.0x10x10
HOPG ZYB Quality, double-sided, piece size 10x10 mm, thickness 0,8-1,8 mm
GRBS_DS/1.0 : 120 € (Add to cart)
GRBS_DS/1.5x10x10
HOPG ZYB Quality, double-sided, piece size 10x10 mm, thickness 1,5 mm
GRBS_DS/1.5 : 160 € (Add to cart)
GRBS_DS/2.0X10X10
HOPG ZYB Quality, double-sided, piece size 10x10 mm, thickness 2,0 mm
GRBS_DS/2.0 : 180 € (Add to cart)
GRHS_DS/1.0x10x10
HOPG ZYH Quality, double-sided, piece size 10x10 mm, thickness 0,8-1,8mm
GRHS_DS/1.0 : 65 € (Add to cart)
GRHS_DS/1.5x10x10
HOPG ZYH Quality, double-sided, piece size 10x10 mm, thickness 1,7mm
GRHS_DS/1.5 : 80 € (Add to cart)
GRHS_DS/2.0x10x10
HOPG ZYH Quality, double-sided, piece size 10x10 mm, thickness 2,0mm
GRHS_DS/2.0 : 90 € (Add to cart)
Mica/15x15
Mica,  Squares, 0.15 mm (0.006")  thickness, size 15 mm x 15 mm (Package of 20 pieces)
150 € (Add to cart)
Mica/dia.9,5
Mica, Disks, 0.15 mm (0.006")  thickness,  size  9.5 mm diameter (Package of 20 pieces)
150 € (Add to cart)
PFM03
Test pattern for Piezoresponce Force Microscopy
470 € (Add to cart)
SiC/0.75
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement
in several nanometers interval. The simplicity of calibration process is provided by nearly uniform distribution of
half-monolayer high (0.75 nm) steps.
150 € (Add to cart)
SiC/1.5
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval. The simplicity of calibration process is provided by nearly uniform distribution of
monolayer high (1.5 nm) steps.
150 € (Add to cart)
Colloidal probes
Product Description Price
Colloidal probes for Contact Mode
5 colloidal probes for Contact mode, 5-9 um diameter spheres, gold reflective coating, sphere material BSG/SiO2.
CPC_SiO2-A/Au/5 (5 probes, SiO2 spheres, size 5-9um): 850 € (Add to cart)
CPC_BSG-A/Au/5 (5 probes, BSG spheres, size 5-9um): 850 € (Add to cart)
Colloidal probes for Force Modulation Mode
5 colloidal probes for Force Modulation mode, 5-9 um diameter spheres, gold reflective coating, sphere material BSG/SiO2.
CPFM_BSG-A/Au/5 (5 probes, BSG spheres, size 5-9um): 850 € (Add to cart)
CPFM_SiO2-A/Au/5 (5 probes, SiO2 spheres, size 5-9um): 850 € (Add to cart)
Colloidal probes for Noncontact/Semicontact Mode
5 colloidal probes for Nonontact mode, 5-9 um diameter spheres, gold reflective coating, sphere material BSG/Si02.
CPN_BSG-A/Au/5 (5 probes, BSG spheres, size 5-9um): 850 € (Add to cart)
CPN_SiO2-A/Au/5 (5 probes, SiO2 spheres, size 5-9um): 850 € (Add to cart)
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